Dr. Yan Zhuang

Assistant Professor - Department of electrical engineering - Wright State University

Contact info

Email: [email protected]
 
Address:
3640 colonel Glenn
Dayton, 45435 Ohio
Tel: (937) 775-4556

 

Links:

 Publications

Journal Publication List

   

48.       Integrated microstrip lines with Co-ta-Zr magnetic films

P. K. Amiri, B. Rejaei, Y. Zhuang, M. Vroubel, D. W. Lee, S. X. Wang, and J.N. Burghartz, IEEE Trans. Magn. Volume: 44, Issue: 11, 2008, pp. 3103-3106

47.       Artificial dielectric shields for integrated transmission lines

Y. Ma, B. Rejaei, Y. Zhuang, IEEE Microwave and wireless components letters, Volume: 18, Issue: 7, 2008, pp. 431-433

46.       Low-loss on-chip transmission lines with micro-patterned artificial dielectric shields

Y. Ma, B. Rejaei, Y. Zhuang, Electronics Letters, Volume: 44, Issue: 15, 2008, pp. 913-915

45.       Magnetic-multilayered interconnects featuring skin effect suppression

Y. Zhuang, B. Rejaei, H. Schellevis,  M. Vroubel, J.N. Burghartz, IEEE Electron Device Lett.  Volume: 29, Issue: 4, 2008, pp. 319-321

44.       Modeling of strained CMOS on disposable SiGe dots: Shape impacts on electrical/thermal characteristics

 S.Fr�gon�se, Y. Zhuang, and J. N. Burghartz, Solid-State Electronics, Vol. 52, 2008, pp. 919�925

43.       Nonreciprocal spin wave spectroscopy of thin Ni-Fe stripes

P. K. Amiri, B. Rejaei, M. Vroubel, Y. Zhuang, Appl. Phys. Lett, Vol. 91, No. 6,  2007, pp. 062502.

42.       Fabrication of in situ ultrathin anodic aluminum oxide layers for nanostructuring on silicon substrate

B. Yan, H. T. M. Pham, Y. Ma, Y. Zhuang, P.M. Sarro, Appl. Phys. Lett., Vol. 91, No. 5, 2007, pp.053117.

41.       Modeling of Strained CMOS on Disposable SiGe Dots : strain impacts on devices� electrical characteristics

S.Fr�gon�se, Y. Zhuang, and J. N. Burghartz; IEEE Transactions on Electron Devices, Vol. 54, No. 9, 2007, pp. 2321.

40.       Ferromagnetic Thin Films for Loss Reduction in On-Chip Transmission Lines

P.K. Amiri, B. Rejaei, Y. Zhuang, M. Vroubel, J.N. Burghartz; IEEE Transactions on Magnetics, Vol. 43, No. 6, June 2007. pp. 2630-2632

39.    Integrated RF inductors with micro-patterned NiFe core

Y. Zhuang, M. Vroubel, B. Rejaei, J.N. Burghartz; Solid-State Electronics, Vol. 51, February 2007, pp. 405-413.

38.    High-resistivity nanogranular Co�Al�O films for high-frequency applications

P.K. Amiri, Y. Zhuang, H. Schellevis, B. Rejaei, M. Vroubel, Y. Ma, J.N. Burghartz; Journal of Applied Physics, Vol. 101, No. 9, 2007,  pp. 09M508/1-3.

37.    Experimental determination of the nonuniform shape-induced anisotropy field in Thin Ni�Fe Films

P.K. Amiri, B. Rejaei, M. Vroubel, Y. Zhuang, J.N. Burghartz; IEEE Transactions on Magnetics, Vol. 43, No. 5, 2007, pp. 1880-1883.

36.    Shape-induced ultra-high magnetic anisotropy and ferromagnetic resonance frequency in micropatterned thin NiFe film

Y. Zhuang, M. Vroubel, B. Rejaei, J.N. Burghartz, K. Attenborough; Journal of Applied Physics, Vol.

99, 2006, pp. 08C705

35.    10 GHZ bandstop microstrip filter using excitation of magnetostatic surface waves in a patterned NiFe ferromagnetic film

M. Vroubel,Y. Zhuang, B. Rejaei, J. N. Burghartz; Journal of Applied Physics, Vol. 99, 2006, pp.

08P506

34.    Magnetic properties of electroplated nano/microgranular NiFe thin films for rf application

Y. Zhuang, M. Vroubel, B. Rejaei, J.N. Burghartz, K. Attenborough; Journal of Applied Physics, Vol.

97, No. 10, Part 2&3, 2005, pp. 1-3.

33.    Calculation of Shape Anisotropy for Micropatterned Thin Fe�Ni Films for On-Chip RF Applications

M. Vroubel, Y. Zhuang, B. Rejaei, J.N. Burghartz, A. Crawford, S. Wang; IEEE Transactions on

Magnetics, Vol. 40, No. 4, July 2004, pp. 2835-2837.

32.    Integrated Tunable Magnetic RF Inductor

M. Vroubel, Y. Zhuang, B. Rejaei, J.N. Burghartz; IEEE Electron Device Letters, Vol. 25, No. 12,

December 2004, pp. 787-789.

31.    Integrated Solenoid Inductors with Patterned Sputter-Deposited Cr/Fe 10Co 90/Cr Ferromagnetic Cores

Y. Zhuang, B. Rejaei, E. Boullaard, M. Vroubel, J.N. Burghartz; IEEE Electron Device Letters, Vol. 24,No. 4, 2003, pp.224-226.

30.    Patterned FeNi thin film for RF and microwave components

M. Vroubel, Y. Zhuang, B. Rejaei, J.N. Burghartz; Journal of Magnetism and Magnetic Materials, Vol.258-259, March 2003, ISSN 0304-8853, pp. 167-169.

29.    X-ray grazing incidence study of inhomogeneous strain relaxation in Si/SiGe wires

A. Daniel, Y. Zhuang, V. Holy, J. Stangl, S. Zerlauth, F. Schaffler, G. Bauer, N. Darowski, and U.

Pietsch; Nuclear Instruments and Methods in Physics Research B, Vol. 200C, 2003, pp. 267-272.

28.    GHz Band-Stop Microstrip Filter Using Patterned Ni 78Fe 22 Ferromagnetic Film

Y. Zhuang, B. Rejaei,E. Boellaard, M. Vroubel , J.N. Burghartz; IEEE Microwave and Wireless

Components Letters, Vol. 12, No. 12, Dec. 2002, pp. 473-475.

27.    Investigation of Microstrips with NiFe Magnetic Thin Film (I): Experiment

Y. Zhuang. M. Vroubel, B. Rejaei, E. Boellaard, J.N. Burghartz; Transactions of The Magnetic Society

of Japan , Vol. 2, No. 5, December 2002, pp. 367-370.

26.    Investigation of Microstrips with NiFe Magnetic Thin Film (II): Modelling

M. Vroubel, Y. Zhuang, B. Rejaei, J.N. Burghartz; Transactions of The Magnetic Society of Japan, Vol.2, No. 5, December 2002, pp. 371-376.

25.    GID study of strains in Si due to patterned SiO2

A. Daniel, V. Holy, Y. Zhuang, T. Roch, J. Grenzer, Z. Bochnicek, G. Bauer; Journal of Physics D

(Applied Physics), Vol. 34, No. 10, 2001, pp. A197-202.

24.    Structural and electronic properties of ZnSe/AlAs heterostructures

S. Rubini, E. Milocco, L. Sorba, E. Pelucchi, A. Franciosi, A. Garulli, A. Parisini, Y. Zhuang, G. Bauer; Physical Review B, Vol. 63, No. 15, 2001, pp. 155312/1-12.

23.    In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction

Y. Zhuang, V. Hol�, J. Stangl, N. Darowski, J. Grenzer, U. Pietsch, S. Zerlauth, F. Sch�ffler, G. Bauer; Physica B, 283, 130 (2000).

22.    Investigation of beta -SiC precipitation in Si 1 - yC y epilayers by X-ray scattering at grazing incidence

Z. Kovats, T. H. Metzger, J. Peisl, J. Stangl, M. Muhlberger, Y. Zhuang, F. Schaffler, G. Bauer; Applied Physics Letter, 76(23), 3409 (2000).

21.    Optical and structural properties of Si/SiGe wires grown on patterned Si substrates

Y. Zhuang, A. Daniel, C. Schelling, F. Sch�ffler, G. Bauer, J. Grenzer, and S. Senz; Thin Solid films,

380, 51 (2000).

20.    Structural and optical properties of Si/Si1-x Gex wires

Y. Zhuang, C. Schelling, J. Stangl, C. Penn, S. Senz, F. Sch�ffler, A. Daniel, U. Pietsch, G. Bauer; Thin Solid films, 369, 409 (2000).

19.    ZnSe/CdTe/ZnSe heterostructures

S. Rubini, B. Bonanni, E. Pelucchi, A. Franciosi, A. Garulli, A. Parisini, Y. Zhuang, G. Bauer, V. Holy; J. Vac. Sci. Technol. (B), 18(4), 2263 (2000).

18.    CdTe epitaxial layers in ZnSe-based heterostructures

S. Rubini, B. Bonanni, E. Pelucchi, A. Franciosi, Y. Zhuang, G. Bauer; Journal of Crystal Growth, 201, 465 (1999).

17.    Investigation of periodicity fluctuations in strained (GaNAs)1/(GaAs)m superlattices by the kinematical simulation of X-ray diffraction

Z. Pan, Y.T. Wang, Y. Zhuang, Y. W. Lin, Z.Q. Zhou, L.H. Li, R.H. Wu, Q.M. Wang; Applied Physics

Letter, 75(2), 223 (1999).

16.    Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high resolution x-ray diffraction and grazing incidence diffraction

Y. Zhuang, V. Holy, J. Stangl, A.A. Darhuber, P. Mikulik, S. Zerlauth, F. Sch�ffler, G. Bauer, N.

Darowski, D. L�bbert, U. Pietsch; Journal of Physics D: Applied Physics 32, 224 (1999).

15.    X-ray diffraction from quantum wires and quantum dots

Y. Zhuang, J. Stangl, A. A. Darhuber, G. Bauer, P. Mikulik, V. Holy, N. Darowski, and U. Pietsch;

Journal of Materials Science: Materials in Electronics 10, 215 (1999).

14.    Epitaxial growth at high rates with LEPECVD

C. Rosenblad, T. Graf, J. Stangl, Y. Zhuang, G. Bauer, J. Schulze, H. von K�nel; Thin Solid Films, 336, 89 (1998).

13.    In-plane strain and strain relaxation in laterally patterned periodic arrays of Si/SiGe quantum wires and dot arrays

N. Darowski, U. Pietsch, Y. Zhuang, S. Zerlauth, G. Bauer, D. L�bbert, and T. Baumbach; Appl. Phys.

Lett., 73(6), 806 (1998).

12.    Strain and surface morphology in lattice-matched ZnSe/InxGa1-xAs heterostructures

S. Heun, J.J. Paggel, L. Sorba, S. Rubini, A. Bonanni, R. Lantier, M. Lazzarino, B. Bonanni, A.

Franciosi, J.-M. Bonard, J.-D. Ganiere, Y. Zhuang, G. Bauer; J. Appl. Phys., 83(5), 2504 (1998).

11.    X-ray scattering study of quantum wires and lateral periodic heterostructures

L. Tapfer, L. De Caro, Y. Zhuang, P. Sciacovelli, A. Sacchetti; Thin Solid Films, 319, 49 (1998).

10.    Lateral periodicity in high-strained (GaIn)As/Ga(PAs) superlattices investigated by x-ray scattering techniques

Y. Zhuang, C. Giannini, L. Tapfer, T. Marschner, W. Stolz; Nuovo Cimento , 19, 377 (1997).

9.    Structural ordering and interface morphology in symmetrically strained(GaIn)As/Ga(PAs) superlattices grown off-oriented GaAs(100)

C. Giannini, L. Tapfer, Y. Zhuang, L. De Caro, T. Marschner, W. Stolz; Phys. Rev. B, 55, 1 (1997).

8.    Study of double barrier superlattice by synchrotron radiation and double-crystal x-ray diffraction

Y. Zhuang, Y.T. Wang, D.S. Jiang, Y.P. Yang, X.M. Jiang, J.Y. Wu, L.S. Xiu, W.L. Zheng; Appl. Phys. Lett. 68 (8), 1147 (1996).

7.    In-plane x-ray scattering of epitaxial structures

S.F. Cui, Y.T. Wang, Y. Zhuang, M. Li, Z.H. Mai; Journal of Crystal Growth, 152, 354 (1995).

6.    X-ray diffraction studies of quantum wire heterostructures

L. Tapfer, L. De Caro, Y. Zhuang, P. Sciacovelli; Semiconductor Heteroepitaxy Growth,

Characterization and Device Applications, 355 (1995).

5.    Determination of surface roughness of InP (001) wafers by x-ray scattering

S.F. Cui, J.H. Li, M. Li, C.R. Li, Y.S. Gu, Z.H. Mai, Y. Zhuang, Y.T. Wang; J. Appl. Phys., 76(7), 4154

(1994).

4.    Surface scattering of x-ray from InP (001) wafers

J.H. Li, S.F. Cui, M. Li, C.R. Li, Z.H. Mai, Y. Zhuang, Y.T. Wang; Appl. Phys. Lett., 65(26), 3317

(1994).

3.    X-ray scattering from a rough surface and damaged layer of polished wafer

M. Li, Z.H. Mai, S.F. Cui, J.H. Li, Y.S. Gu, Y.T. Wang, Y. Zhuang; J. Phys. D, 27(9), 1929 (1994).

2.    A transmission electron microscopy study of interphase dislocation between decagonal quasicrystalline and crystalline phase in Al75Ni10Fe15 alloy

Y. Zhuang, Z. Zhang, D.B. Williams; Journal of Non-crystalline Solids, 153\154, 119 (1993).

1.    A transmission electron microscopy study of dislocations in Al70Ni10Co20 and Al75Ni10Fe15 decagonal quasicrystals

Z. Zhang, Y. Zhuang; Philosophical Magazine Letters, 65(4), 2039 (1992).

Conference proceeding:

11.    Thin film magnetic materials for RFIC passives

Y. Zhuang, M. Vroubel, B. Rejaei, J. N. Burghartz; Proc. IEEE Bipolar/BiCMOS Circuit and

Technology Meeting (BCTM 2005, Invited), October 9-11, 2005, Santa Barbara , CA , USA , pp. 26-32.

10.    Assessment of ferromagnetic integrated inductors for Si-technology

B. Rejaei, M. Vroubel, Y. Zhuang, J.N. Burghartz; Digest of Papers 4th Topical Meeting on Silicon

Monolithic Integrated Circuits in RF Systems, 9-11 April 2003, near Garmisch, Southern Germany, pp.100-103.

9.    Ferromagnetic RF Inductors and Transformers for Standard CMOS/BiCMOS

Y. Zhuang, M. Vroubel, B. Rejaei, J. Burghartz; Technical Digest IEDM 2002, 9-11 December 2002,

San Francisco Hilton & Towers Hotel, San Francisco, CA, USA, ISBN 0-7803-7463-0, pp. 18.06/1-

18.06/4.

8.    Microstrips with Micro-patterned Ni 78Fe 22 Ferromagnetic Film for RF Passives

Y. Zhuang, M. Vroubel, B. Rejaei, E. Boellaard, J.N. Burghartz; Proc. SAFE 2002, November 27-28,

2002, Veldhoven, The Netherlands , pp. 136-140.

7.    Patterned Magnetic Thin Films for RF Applications

M. Vroubel, B. Rejaei, Y. Zhuang, J.N. Burghartz; Book of reviewed abstracts, SCEE-2002, 23-38 June 2002, Eindhoven, The Netherlands, pp. 195-196.

6.    Permeability and Resonance Frequency of Patterned Magnetic Thin Films

M. Vroubel, B. Rejaei, Y. Zhuang, J.N. Burghartz; SAFE 2001, Veldhoven, the Netherlands, 29-30

November 2001, pp. 1-5.

5.    Study of Magnetic On-chip Inductors

Y. Zhuang, B. Rejaei, E. Boellaard, M. Vroubel, J.N. Burghartz; Proc. SAFE 2001, Nov. 28-29, 2001,

Veldhoven, the Netherlands , pp. 229-233.

4.    Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution x-ray diffraction

Y. Zhuang, C. Schelling, T. Roch, A. Daniel, F. Sch�ffler, G. Bauer, J. Grenzer, U. Pietsch, S. Senz;

Mat. Res. Soc. Symp. Proc., 590, 207 (2000).

3.    Structural and photoelectric studies on double barrier quantum well IR detectors

D.S. Jiang, L.Q. Cui, W.G. Wu, C.Y. Song, Y. Zhuang, Y.T. Wang, R.Z. Wang;

Proceedings of the Eighth International Conference on Narrow Gap Semiconductors, World Scientific,

Singapore , 172 (1998).

2.    Structural and photoelectric studies on double barrier quantum well infrared detectors

W.G. Wu, D.S. Jiang, L.Q. Cui, C.Y. Song, Y. Zhuang; 1997 IEEE Hong Kong Electron Devices

Meeting (Cat. No.97TH8260). IEEE, New York, NY, USA ; 110-13 (1997).

1.    X ray diffraction analysis of self-organized InAs quantum dots

Y. Zhuang, Y.T. Wang, W.Q. Ma, W. Wang, X.P. Yang, Z.G. Chen, D.S. Jiang, H.Z. Zheng; Proc.SPIE

Vol. 2897, 75 (1996).